Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Modeling and Characterization of Vertical GaN Schottky Diodes With AlGaN Cap Layers
Article (Web of Science)
Overview
Additional Document Info
View All
Overview
authors
Hontz, Michael R.
Cao, Yu
Chen, Mary
Li, Ray
Garrido, Austin
Chu, Rongming
Khanna, Raghav
publication date
2017
webpage
http://dx.doi.org/10.1109/ted.2017.2686778
published in
IEEE TRANSACTIONS ON ELECTRON DEVICES
Journal
Additional Document Info
number of pages
6
start page
2172
end page
2178
volume
64
issue
5