Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Dielectric functions of thin interface layers in a-Si:H-based device structures by spectroscopic ellipsometry
Article (Web of Science)
Overview
Additional Document Info
View All
Overview
publication date
1989
webpage
http://dx.doi.org/10.1016/0022-3093(89)90099-9
published in
JOURNAL OF NON-CRYSTALLINE SOLIDS
Journal
Additional Document Info
number of pages
2
start page
160
end page
162
volume
114