Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Journal
Overview
Identity
Other
View All
Overview
publication venue for
Single-Event Transients in Vertical GaN Diodes With
N
-Implanted Hybrid Edge Termination
. 72:2333-2339.
2025
Identity
International Standard Serial Number (ISSN)
0018-9499
Electronic International Standard Serial Number (EISSN)
1558-1578
Other
journal abbreviation
IEEE T NUCL SCI