An Automated SPICE Modeling Procedure Utilizing Static and Dynamic Characterization of Power FETs Proceedings Paper (Web of Science)

cited authors

  • Sellers, Andrew J.; Hontz, Michael R.; Khanna, Raghav; Lemmon, Andrew N.; Shahabi, Ali; IEEE


publication date

  • January 1, 2018


author keyword

  • Level-3 MOSFET model
  • modeling
  • wide bandgap devices

start page

  • 255

end page

  • 262