An Automated SPICE Modeling Procedure Utilizing Static and Dynamic Characterization of Power FETs

Proceedings Paper (Web of Science)

• cited authors: Sellers, Andrew J.; Hontz, Michael R.; Khanna, Raghav; Lemmon, Andrew N.; Shahabi, Ali; IEEE
• authors: Khanna, Raghav
• publication date: January 1, 2018
• webpage: Web of Science
• published in: 2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC) Book

author keyword

• Level-3 MOSFET model
• modeling
• wide bandgap devices

• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category
• start page: 255
• end page: 262