Effects of Parasitic Inductance on Performance of 600-V GaN Devices

Proceedings Paper (Web of Science)

• cited authors: Sellers, Andrew J.; Tine, Cheikh; Kini, Roshan L.; Hontz, Michael R.; Khanna, Raghav; Lemmon, Andrew N.; Shahabi, Ali; New, Christopher; IEEE
• authors: Khanna, Raghav
• publication date: January 1, 2017
• webpage: Web of Science
• published in: 2017 IEEE ELECTRIC SHIP TECHNOLOGIES SYMPOSIUM (ESTS) Conference (Web of Science)

author keyword

• Cascode
• Device modeling
• Double pulse testing
• Gallium nitride (GaN)
• Parasitic lead inductance

• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category
• start page: 50
• end page: 55