Measuring relative carrier concentrations at the nanoscale using scanning microwave impedance microscopy: The case of CdTe solar cells Proceedings Paper (Web of Science)

cited authors

  • Tuteja, Mohit; Koirala, Prakash; Palekis, Vasilios; MacLaren, Scott; Ferekides, Christos S.; Collins, Robert W.; Rockett, Angus A.; IEEE

publication date

  • January 1, 2016


author keyword

  • CdTe
  • grain boundaries
  • microwave microscopy


start page

  • 3378

end page

  • 3381