In situ real time spectroscopic ellipsometry analysis of Ag nanoparticle layers for back contact reflector applications Proceedings Paper (Web of Science)

cited authors

  • Little, S. A.; Ranjan, V.; Begou, T.; Collins, R. W.; Marsillac, S.; IEEE

publication date

  • January 1, 2012


published in

author keyword

  • nanoparticles
  • photovoltaic cells
  • spectroscopic ellipsometry
  • thin film devices


start page

  • 2006

end page

  • 2008