Real time analysis of ultra-thin CIGS thin film deposition Proceedings Paper (Web of Science)

cited authors

  • Ranjan, Vikash; Aryal, Krishna; Little, Scott; Erkaya, Yunus; Rajan, Grace; Boland, Patrick; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Collins, Robert W.; Marsillac, Sylvain; IEEE

publication date

  • January 1, 2012

webpage

published in

author keyword

  • ellipsometry
  • gallium-based semiconductor materials
  • optical variables measurement
  • photovoltaic cells
  • semiconductor film
  • thickness measurement

category