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Real time analysis of ultra-thin CIGS thin film deposition
Proceedings Paper (Web of Science)
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cited authors
Ranjan, Vikash; Aryal, Krishna; Little, Scott; Erkaya, Yunus; Rajan, Grace; Boland, Patrick; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Collins, Robert W.; Marsillac, Sylvain; IEEE
publication date
January 1, 2012
webpage
Web of Science
published in
2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
Conference (Web of Science)
Research
author keyword
ellipsometry
gallium-based semiconductor materials
optical variables measurement
photovoltaic cells
semiconductor film
thickness measurement
category
PHYSICS, APPLIED
Category