Real time analysis of ultra-thin CIGS thin film deposition

Proceedings Paper (Web of Science)

• cited authors: Ranjan, Vikash; Aryal, Krishna; Little, Scott; Erkaya, Yunus; Rajan, Grace; Boland, Patrick; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Collins, Robert W.; Marsillac, Sylvain; IEEE
• publication date: January 1, 2012
• webpage: Web of Science
• published in: 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) Conference (Web of Science)

author keyword

• ellipsometry
• gallium-based semiconductor materials
• optical variables measurement
• photovoltaic cells
• semiconductor film
• thickness measurement

• category: PHYSICS, APPLIED Category