Overview
cited authors
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Ranjan, Vikash; Aryal, Krishna; Little, Scott; Erkaya, Yunus; Rajan, Grace; Boland, Patrick; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Collins, Robert W.; Marsillac, Sylvain; IEEE
Research
author keyword
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ellipsometry
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gallium-based semiconductor materials
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optical variables measurement
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photovoltaic cells
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semiconductor film
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thickness measurement