Electronic and structural properties of copper selenide (Cu2-xSe) thin films as determined by in-situ real-time and ex-situ characterization Proceedings Paper (Web of Science)

cited authors

  • Khatri, H.; Aryae, K.; Collins, R. W.; Marsillac, S.; IEEE

publication date

  • January 1, 2012


published in

author keyword

  • ellipsometry
  • optical variables measurement
  • photovoltaic cells
  • semiconductor film
  • thickness measurement