Electronic and structural properties of copper selenide (Cu2-xSe) thin films as determined by in-situ real-time and ex-situ characterization

Proceedings Paper (Web of Science)

• cited authors: Khatri, H.; Aryae, K.; Collins, R. W.; Marsillac, S.; IEEE
• publication date: January 1, 2012
• webpage: Web of Science
• published in: 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) Conference (Web of Science)

author keyword

• ellipsometry
• optical variables measurement
• photovoltaic cells
• semiconductor film
• thickness measurement

• category: PHYSICS, APPLIED Category