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Electronic and structural properties of copper selenide (Cu2-xSe) thin films as determined by in-situ real-time and ex-situ characterization
Proceedings Paper (Web of Science)
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cited authors
Khatri, H.; Aryae, K.; Collins, R. W.; Marsillac, S.; IEEE
publication date
January 1, 2012
webpage
Web of Science
published in
2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
Conference (Web of Science)
Research
author keyword
ellipsometry
optical variables measurement
photovoltaic cells
semiconductor film
thickness measurement
category
PHYSICS, APPLIED
Category