Through-the-Glass Optical Metrology for Mapping 60 cm x 120 cm CdTe Photovoltaic Panels in Off-Line and On-Line Configurations

Proceedings Paper (Web of Science)

• cited authors: Chen, Jie; Koirala, Prakash; Salupo, Carl; Collins, R. W.; Marsillac, Sylvain; Kormanyos, Kenneth R.; Johs, Blaine D.; Hale, Jeffrey S.; Pfeiffer, Galen L.; IEEE
• publication date: January 1, 2012
• webpage: Web of Science
• published in: 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) Conference (Web of Science)

author keyword

• II-VI semiconductor materials
• ellipsometry
• metrology
• photovoltaic cells
• thin films

• category: PHYSICS, APPLIED Category