Through-the-Glass Optical Metrology for Mapping 60 cm x 120 cm CdTe Photovoltaic Panels in Off-Line and On-Line Configurations Proceedings Paper (Web of Science)

Industry Collaboration

cited authors

  • Chen, Jie; Koirala, Prakash; Salupo, Carl; Collins, R. W.; Marsillac, Sylvain; Kormanyos, Kenneth R.; Johs, Blaine D.; Hale, Jeffrey S.; Pfeiffer, Galen L.; IEEE

publication date

  • January 1, 2012


published in

author keyword

  • II-VI semiconductor materials
  • ellipsometry
  • metrology
  • photovoltaic cells
  • thin films