Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films Article (Web of Science)

Industry Collaboration International Collaboration

cited authors

  • Abou-Ras, D.; Caballero, R.; Fischer, C. -H.; Kaufmann, C. A.; Lauermann, I.; Mainz, R.; Moenig, H.; Schoepke, A.; Stephan, C.; Streeck, C.; Schorr, S.; Eicke, A.; Doebeli, M.; Gade, B.; Hinrichs, J.; Nunney, T.; Dijkstra, H.; Hoffmann, V.; Klemm, D.; Efimova, V.; Bergmaier, A.; Dollinger, G.; Wirth, T.; Unger, W.; Rockett, A. A.; Perez-Rodriguez, A.; Alvarez-Garcia, J.; Izquierdo-Roca, V.; Schmid, T.; Choi, P. -P.; Mueller, M.; Bertram, F.; Christen, J.; Khatri, H.; Collins, R. W.; Marsillac, S.; Koetschau, I.

publication date

  • October 1, 2011

webpage

published in

author keyword

  • Cu(In,Ga)Se(2)
  • chalcopyrite-type
  • chemical mapping
  • comparison
  • depth profiling
  • elemental distributions
  • solar cells
  • thin films

category

start page

  • 728

end page

  • 751

volume

  • 17

issue

  • 5