Focused ion beam and electron microscopy characterization of nanosharp tips and microbumps on silicon and metal thin films formed via localized single-pulse laser irradiation Article (Web of Science)

cited authors

  • Moening, Joseph P.; Georgiev, Daniel G.; Lawrence, Joseph G.

authors

publication date

  • January 1, 2011

webpage

published in

category

volume

  • 109

issue

  • 1