Real-Time Spectroscopic Ellipsometry of Sputtered CdTe Thin Films: Effect of Ar Pressure on Structural Evolution and Photovoltaic Performance Proceedings Paper (Web of Science)

cited authors

  • Sestak, Michelle N.; Li, Jian; Paudel, Naba R.; Wieland, Kristopher A.; Chen, Jie; Thornberry, Courtney; Collins, Robert W.; Compaan, Alvin D.; MRS, Yamada; A, Heske; C, Contreras; MA, Igalson; M, Irvine; SJC

publication date

  • January 1, 2010


published in

start page

  • 393

end page

  • +


  • 1165