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Ion implantation induced disorder in single-crystal and sputter-deposited polycrystalline CdTe characterized by ellipsometry and backscattering spectrometry
Proceedings Paper (Web of Science)
International Collaboration
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cited authors
Petrik, P.; Khanh, N. Q.; Li, Jian; Chen, Jie; Collins, R. W.; Fried, M.; Radnoczi, G. Z.; Lohner, T.; Gyulai, J.; Arwin, H; Beck, U; Schubert, M
publication date
January 1, 2008
webpage
Web of Science
published in
ADVANCED PRECISION ENGINEERING
Book
Research
category
SPECTROSCOPY
Category
Additional Document Info
start page
1358
end page
+
volume
5
issue
5