Ion implantation induced disorder in single-crystal and sputter-deposited polycrystalline CdTe characterized by ellipsometry and backscattering spectrometry Proceedings Paper (Web of Science)

International Collaboration

cited authors

  • Petrik, P.; Khanh, N. Q.; Li, Jian; Chen, Jie; Collins, R. W.; Fried, M.; Radnoczi, G. Z.; Lohner, T.; Gyulai, J.; Arwin, H; Beck, U; Schubert, M

publication date

  • January 1, 2008

webpage

published in

category

start page

  • 1358

end page

  • +

volume

  • 5

issue

  • 5