Multichannel Mueller matrix analysis of the evolution of surface roughness on different in-plane scales during polycrystalline film processing Proceedings Paper (Web of Science)

cited authors

  • Chen, C; Ross, C; Wronski, CR; Collins, RW; Shafarman, W; Gessert, T; Niki, S; Siebentritt, S

publication date

  • January 1, 2005

webpage

published in

category

start page

  • 3

end page

  • 8

volume

  • 865