Spectroscopic ellipsometry and atomic force microscopy studies of RF sputtered Cd1-xMnxTe films Proceedings Paper (Web of Science)

cited authors

Wang, SL; Jian, U; Chen, J; Collins, RW; Compaan, AD; IEEE

publication date

January 1, 2005

webpage

Web of Science

published in

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 Book

category

PHYSICS, APPLIED Category

start page

480

end page

483