Hybrid Edge Termination in Vertical GaN: Approximating Beveled Edge Termination via Discrete Implantations

Article (Web of Science)

• cited authors: Nelson, Tolen; Pandey, Prakash; Georgiev, Daniel G.; Hontz, Michael R.; Koehler, Andrew D.; Hobart, Karl D.; Anderson, Travis J.; Ildefonso, Adrian; Khanna, Raghav
• publication date: December 1, 2022
• webpage: Web of Science
• published in: IEEE TRANSACTIONS ON ELECTRON DEVICES Journal
• category: PHYSICS, APPLIED Category

keywords

• Avalanche breakdown
• TCAD
• edge termination
• electric breakdown
• gallium nitride
• modeling
• p-n diode
• vertical diodes

• start page: 6940
• end page: 6947
• volume: 69
• issue: 12