Negative Differential Resistance (NDR) Behavior of Nickel Oxide (NiO) Based Metal-Insulator-Semiconductor Structures

Article (Web of Science)

• cited authors: Khan, Kamruzzaman; Itapu, Srikanth; Georgiev, Daniel G.
• authors: Georgiev, Daniel G
• publication date: January 1, 2020
• webpage: Web of Science
• published in: JOURNAL OF ELECTRONIC MATERIALS Journal
• category: PHYSICS, APPLIED Category

keywords

• MIS structures
• Nickel oxide
• negative differential resistance
• tunneling

• start page: 333
• end page: 340
• volume: 49
• issue: 1