Analytical and experimental optimization of external gate resistance for safe rapid turn on of normally off GaN HFETs Proceedings (Faculty180)

cited authors

  • Barchowsky, Ansel; Kozak, Joseph P; Hontz, Michael R; Stanchina, William E; Reed, Gregory F; Mao, Zhi-Hong; Khanna, Raghav

authors

publication date

  • 2017

publisher

  • IEEE  Organization

presented at event