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Analytical and experimental optimization of external gate resistance for safe rapid turn on of normally off GaN HFETs
Proceedings (Faculty180)
Overview
Overview
cited authors
Barchowsky, Ansel; Kozak, Joseph P; Hontz, Michael R; Stanchina, William E; Reed, Gregory F; Mao, Zhi-Hong; Khanna, Raghav
authors
Khanna, Raghav
publication date
2017
publisher
IEEE
Organization
presented at event
Applied Power Electronics Conference and Exposition (APEC), 2017 IEEE
Conference