An analytical model for evaluating the influence of device parasitics on Cdv/dt induced false turn-on in SiC MOSFETs Proceedings (Faculty180)

cited authors

  • Khanna, Raghav; Amrhein, Andrew; Stanchina, William; Reed, Gregory; Mao, Zhi-Hong

authors

publication date

  • 2013

publisher

  • IEEE  Organization

presented at event