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An analytical model for evaluating the influence of device parasitics on Cdv/dt induced false turn-on in SiC MOSFETs
Proceedings (Faculty180)
Overview
Overview
cited authors
Khanna, Raghav; Amrhein, Andrew; Stanchina, William; Reed, Gregory; Mao, Zhi-Hong
authors
Khanna, Raghav
publication date
2013
publisher
IEEE
Organization
presented at event
Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
Conference