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Hybrid Edge Termination for High-Voltage Vertical GaN Devices: Empirical Validation and Robust Processing Tolerance
Article (Faculty180)
Overview
Overview
cited authors
Pandey, Prakash; Nelson, Tolen M; Hontz, Michael R; Georgiev, Daniel G; Khanna, Raghav; Jacobs, Alan G; Lundh, James S; Gallagher, James C; Koehler, Andrew D; Hobart, Karl D; others
authors
Khanna, Raghav
publication date
2024
published in
IEEE Transactions on Electron Devices