Hybrid Edge Termination for High-Voltage Vertical GaN Devices: Empirical Validation and Robust Processing Tolerance Article (Faculty180)

cited authors

  • Pandey, Prakash; Nelson, Tolen M; Hontz, Michael R; Georgiev, Daniel G; Khanna, Raghav; Jacobs, Alan G; Lundh, James S; Gallagher, James C; Koehler, Andrew D; Hobart, Karl D; others

authors

publication date

  • 2024

published in