Experimental Validation of Robust Hybrid Edge Termination Structures in Vertical GaN pin Diodes with Avalanche Capability

Article (Faculty180)

cited authors

  • Lundh, James Spencer; Jacobs, Alan G; Pandey, Prakash; Nelson, Tolen; Georgiev, Daniel G; Koehler, Andrew D; Khanna, Raghav; Tadjer, Marko J; Hobart, Karl D; Anderson, Travis J

authors

publication date

  • 2024

published in