Examination of trapping effects on single-event transients in GaN HEMTs Article (Faculty180)

cited authors

  • Nelson, Tolen; Georgiev, Daniel G; Hontz, Michael R; Khanna, Raghav; Ildefonso, Adrian; Koehler, Andrew D; Hobart, Karl; Khachatrian, Ani; McMorrow, Dale

authors

publication date

  • 2022

published in

start page

  • 328

volume

  • 70