Characterization of iridium oxide thin films deposited by pulsed-direct-current reactive sputtering Article (Faculty180)

cited authors

  • Thanawala, Sachin; Georgiev, Daniel G.; Baird, Ronald J.; Auner, Gregory

authors

publication date

  • 2007

published in

start page

  • 7059

end page

  • 7065

volume

  • 515