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Focused ion beam and electron microscopy characterization of nanosharp tips and microbumps on silicon and metal thin films formed via localized single-pulse laser irradiation
Article (Faculty180)
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cited authors
Moening, Joseph P.; Georgiev, Daniel G.; Lawrence, Joseph G.
authors
Georgiev, Daniel G
publication date
2011
published in
JOURNAL OF APPLIED PHYSICS
Journal
Additional Document Info
volume
109