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An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs
Article (Faculty180)
Overview
Overview
cited authors
Kini, Roshan; Dhakal, Shankar; Mahmud, Sadab; Sellers, Andrew J; Hontz, Michael R; Tine, Cheikh; Khanna, Raghav
authors
Khanna, Raghav
publication date
2020
published in
IEEE Access
Journal