An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs Article (Faculty180)

cited authors

  • Kini, Roshan; Dhakal, Shankar; Mahmud, Sadab; Sellers, Andrew J; Hontz, Michael R; Tine, Cheikh; Khanna, Raghav

authors

publication date

  • 2020

published in