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An automated SPICE modeling procedure utilizing static and dynamic characterization of power FETs
Proceedings (Faculty180)
Overview
Overview
cited authors
Sellers, Andrew J; Hontz, Michael R; Khanna, Raghav; Lemmon, Andrew N; Shahabi, Ali
authors
Khanna, Raghav
publication date
2018
publisher
IEEE
Organization
presented at event
Applied Power Electronics Conference and Exposition (APEC), 2018 IEEE
Conference