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Spectroscopic ellipsometry and atomic force microscopy studies of RF sputtered Cd/sub 1-x/Mn/sub x/Te films
Proceedings Paper (Web of Science)
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Identity
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authors
Shanli Wang
Jian Li
Jie Chen
Compaan, A.D.
webpage
http://dx.doi.org/10.1109/pvsc.2005.1488174
Identity
International Standard Book Number (ISBN) 10
0780387074