An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs Article (Web of Science)

authors

  • Kini, Roshan L.
  • Dhakal, Shankar
  • Mahmud, Sadab
  • Sellers, Andrew J.
  • Hontz, Michael R.
  • Tine, Cheikh A.
  • Khanna, Raghav

publication date

  • 2020

webpage

published in

number of pages

  • 9

start page

  • 137312

end page

  • 137321

volume

  • 8