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Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films
Article (Web of Science)
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authors
Lee, Joungchel
Koh, Joohyun
publication date
2001
webpage
http://dx.doi.org/10.1063/1.1347969
published in
REVIEW OF SCIENTIFIC INSTRUMENTS
Journal
Additional Document Info
start page
1742
volume
72
issue
3