Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Thin-film coalescence in hydrogenated amorphous silicon probed by spectroscopic ellipsometry with millisecond-scale resolution
Article (Web of Science)
Overview
Additional Document Info
View All
Overview
authors
Li, Y.-M.
An, Ilsin
Nguyen, H. V.
Wronski, C. R.
publication date
1992
webpage
http://dx.doi.org/10.1103/physrevlett.68.2814
published in
PHYSICAL REVIEW LETTERS
Journal
Additional Document Info
number of pages
3
start page
2814
end page
2817
volume
68
issue
18