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Optical characterization of a four-medium thin film structure by real time spectroscopic ellipsometry: amorphous carbon on tantalum
Article (Web of Science)
Overview
Additional Document Info
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authors
Cong, Yue
An, IIsin
Vedam, K.
publication date
1991
webpage
http://dx.doi.org/10.1364/ao.30.002692
published in
Applied Optics
Journal
Additional Document Info
start page
2692
volume
30
issue
19