Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Journal
Overview
Identity
View All
Overview
publication venue for
Field emission properties of BN coated Si tips by pulsed ArF laser deposition
. 17:237.
1999
Scanning tunneling microscopy of passivated Au nanocrystals immobilized on Au(111) surfaces
. 17:2411.
1999
Damage to Si substrates during SiO2 etching: A comparison of reactive ion etching and magnetron-enhanced reactive ion etching
. 12:567.
1994
In situ ellipsometry of thin-film deposition: Implications for amorphous and microcrystalline Si growth
. 7:1155.
1989
publisher
American Vacuum Society
Publisher
Identity
International Standard Serial Number (ISSN)
0734-211X