Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films Article (Web of Science)

authors

  • Fujiwara, H.
  • Koh, Joohyun
  • Rovira, P. I.

publication date

  • 2000

published in

number of pages

  • 12

start page

  • 10832

end page

  • 10844

volume

  • 61

issue

  • 16