Thickness evolution of the microstructural and optical properties of Si:H films in the amorphous-to-microcrystalline phase transition region Proceedings Paper (Web of Science)

authors

  • Ferlauto, A.S.
  • Ferreira, G.M.
  • Koval, R.J.
  • Pearce, J.M.
  • Wronski, C.R.
  • Collins, Robert W
  • Al-Jassim, M.M.
  • Jones, K.M.

International Standard Book Number (ISBN) 10

  • 0780374711