Application of real-time spectroscopic ellipsometry for characterizing the structure and optical properties of microcrystalline component layers of amorphous semiconductor solar cells Article (Web of Science)

authors

  • Koh, Joohyun
  • Fujiwara, H.
  • Wronski, C.R.

publication date

  • 1997

webpage

published in

number of pages

  • 7

start page

  • 135

end page

  • 142

volume

  • 49

issue

  • 1-4