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Ellipsometry for thin-film and surface analysis
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Kim, Yeon Taik
publication date
1990
webpage
http://dx.doi.org/10.1021/ac00216a001
published in
ANALYTICAL CHEMISTRY
Journal
Additional Document Info
start page
887A
end page
890A
volume
62
issue
17