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Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry
Article (Web of Science)
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Additional Document Info
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authors
Ferlauto, A.S.
Ferreira, G.M.
Chen, Chi
Koh, Joohyun
Koval, R.J.
Lee, Yeeheng
Pearce, J.M.
Wronski, C.R.
publication date
2003
webpage
http://dx.doi.org/10.1016/s0927-0248(02)00436-1
published in
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Journal
Additional Document Info
number of pages
37
start page
143
end page
180
volume
78
issue
1-4