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Multichannel Mueller Matrix Ellipsometry for Simultaneous Real-Time Measurement of Bulk Isotropic and Surface Anisotropic Complex Dielectric Functions of Semiconductors
Article (Web of Science)
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authors
Chen, Chi
An, Ilsin
publication date
2003
webpage
http://dx.doi.org/10.1103/physrevlett.90.217402
published in
PHYSICAL REVIEW LETTERS
Journal
Additional Document Info
start page
217402
volume
90
issue
21