Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Real time spectroellipsometry characterization of optical gap profiles in compositionally‐graded semiconductor structures: Applications to bandgap engineering in amorphous silicon‐carbon alloy solar cells
Article (Web of Science)
Overview
Additional Document Info
View All
Overview
authors
Kim, Sangbo
Burnham, J. S.
Koh, Joohyun
Jiao, Lihong
Wronski, C. R.
publication date
1996
webpage
http://dx.doi.org/10.1063/1.363077
published in
JOURNAL OF APPLIED PHYSICS
Journal
Additional Document Info
number of pages
9
start page
2420
end page
2429
volume
80
issue
4