Real time spectroellipsometry characterization of optical gap profiles in compositionally‐graded semiconductor structures: Applications to bandgap engineering in amorphous silicon‐carbon alloy solar cells Article (Web of Science)

authors

  • Kim, Sangbo
  • Burnham, J. S.
  • Koh, Joohyun
  • Jiao, Lihong
  • Wronski, C. R.
  • Collins, Robert W

publication date

  • 1996

published in

number of pages

  • 9

start page

  • 2420

end page

  • 2429

volume

  • 80

issue

  • 4