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Simultaneous real‐time spectroscopic ellipsometry and reflectance for monitoring thin‐film preparation
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
An, Ilsin
Nguyen, H. V.
Heyd, A. R.
publication date
1994
webpage
http://dx.doi.org/10.1063/1.1144527
published in
REVIEW OF SCIENTIFIC INSTRUMENTS
Journal
Additional Document Info
number of pages
11
start page
3489
end page
3500
volume
65
issue
11