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Real time monitoring of filament-assisted chemically vapor deposited diamond by spectroscopic ellipsometry
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Cong, Yue
An, Ilsin
Nguyen, H.V.
Vedam, K.
Messier, R.
publication date
1991
webpage
http://dx.doi.org/10.1016/0257-8972(91)90087-d
published in
SURFACE & COATINGS TECHNOLOGY
Journal
Additional Document Info
number of pages
5
start page
381
end page
386
volume
49
issue
1-3