Wild Band Edges: The Role of Bandgap Grading and Band-Edge Fluctuations in High-Efficiency Chalcogenide Devices Proceedings Paper (Web of Science)

International Collaboration

cited authors

  • Repins, Ingrid; Mansfield, Lorelle; Kanevce, Ana; Jensen, Soren A.; Kuciauskas, Darius; Glynn, Stephen; Barnes, Teresa; Metzger, Wyatt; Burst, James; Jiang, Chun-Sheng; Dippo, Patricia; Harvey, Steve; Teeter, Glenn; Perkins, C.; Egaas, Brian; Zakutayev, Andriy; Alsmeier, Jan-Hendrik; Lussky, Thomas; Korte, Lars; Wilks, Regan G.; Baer, Marcus; Yan, Yanfa; Lany, Stephan; Zawadzki, Pawel; Park, Ji-Sang; Wei, Suhuai; IEEE

authors

publication date

  • January 1, 2016

webpage

author keyword

  • CAS
  • CIGS
  • CTS
  • CZTS
  • CdTe
  • defect
  • fluctuations
  • grading

category

start page

  • 309

end page

  • 314