Nanoscale doping profiles within CdTe grain boundaries and at the CdS/CdTe interface revealed by atom probe tomography and STEM EBIC Article (Web of Science)

International Collaboration

cited authors

  • Poplawsky, Jonathan D.; Li, Chen; Paudel, Naba R.; Guo, Wei; Yan, Yanfa; Pennycook, Stephen J.

authors

publication date

  • June 1, 2016

webpage

published in

author keyword

  • Atom probe tomography
  • CdTe
  • Electron beam induced current
  • Scanning transmission electron microscopy
  • Thin films

category

start page

  • 95

end page

  • 101

volume

  • 150