Overview
cited authors
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Xiao, Chuanxiao; Moutinho, Helio; Jiang, Chun-Sheng; To, Bobby; Levi, Dean; Yan, Yanfa; Al-Jassim, Mowafak; IEEE
Research
author keyword
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CIGS
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Scanning capacitance
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cross-section
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depletion region
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junction
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resolution
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sample preparation