Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films Proceedings Paper (Web of Science)

cited authors

  • Wang, Zhiwei; Jones, Kim M.; Norman, Andrew G.; Moseley, John; Repins, Ingrid L.; Noufi, Rommel; Yan, Yanfa; Al-Jassim, Mowafak M.; IEEE

authors

publication date

  • January 1, 2013

webpage

author keyword

  • Cu2ZnSnSe4
  • cathodoluminescence
  • electron microscopy
  • grain boundary
  • polycrystalline thin film

category

start page

  • 1681

end page

  • 1684