Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

Proceedings Paper (Web of Science)

• cited authors: Wang, Zhiwei; Jones, Kim M.; Norman, Andrew G.; Moseley, John; Repins, Ingrid L.; Noufi, Rommel; Yan, Yanfa; Al-Jassim, Mowafak M.; IEEE
• authors: Yan, Yanfa
• publication date: January 1, 2013
• webpage: Web of Science
• published in: 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2 Book

author keyword

• Cu2ZnSnSe4
• cathodoluminescence
• electron microscopy
• grain boundary
• polycrystalline thin film

• category: PHYSICS, APPLIED Category
• start page: 1681
• end page: 1684