FPGA Memory Testing Technique using BIST

Proceedings Paper (Web of Science)

• cited authors: Gadde, Priyanka; Niamat, Mohammed; Carletta, J; Geiger, RL
• authors: Niamat, Mohammed Y
• publication date: January 1, 2013
• webpage: Web of Science
• published in: 2012 IEEE 55TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS) Book
• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category
• start page: 473
• end page: 476