A built in self test scheme for automatic interconnect fault diagnosis in multiple and single FPGA systems.

Proceedings Paper (Web of Science)

• cited authors: Niamat, M. Y.; Sahni, Arunjit; Jamali, M. M.; IEEE
• authors: Niamat, Mohammed Y
• publication date: January 1, 2007
• webpage: Web of Science
• published in: 2007 50TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3 Book
• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category
• start page: 194
• end page: +