Scaled Projections of Empirically Verified Hybrid Edge Terminated Vertical GaN Diodes to 20 kV Proceedings Paper (Web of Science)

cited authors

  • Nelson, Tolen; Pandey, Prakash; Georgiev, Daniel G.; Khanna, Raghav; Hontz, Michael R.; Jacobs, Alan G.; Gallagher, James C.; Koehler, Andrew D.; Hobart, Karl D.; Anderson, Travis J.; IEEE

publication date

  • January 1, 2023

webpage

keywords

  • Gallium Nitride
  • PN diode
  • TCAD
  • avalanche breakdown
  • edge termination
  • electric breakdown
  • modeling
  • vertical diodes