Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization Article (Web of Science)

cited authors

  • Ebdah, M. A.; Kordesch, M. E.; Yuan, W.; Jadwisienczak, W. M.; Kaya, S.; Nazzal, M. D.; Ibdah, A.; Al-iqdah, K. S.

publication date

  • December 2, 2025

webpage

published in

category

keywords

  • dielectric functions
  • exciton
  • general oscillator
  • optical functions
  • phonon
  • spectroscopic ellipsometry
  • strain
  • stress
  • zinc oxide

volume

  • 15

issue

  • 12